Abhishek Koneru

17 papers A 2B 2C 2Misc 3Journal 6Unranked 2
YearRankTypeTitle / Venue / Authors
2022 J jnl
Disruptive Changes in Field Equation Modeling: A Simple Interface for Wafer Scale Engines.
CoRR
Mino Woo, Terry Jordan, Robert Schreiber, Ilya Sharapov, Shaheer Muhammad, Abhishek Koneru, Michael James, Dirk Van Essendelft
2020 J jnl
An Interlayer Interconnect BIST and Diagnosis Solution for Monolithic 3-D ICs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Abhishek Koneru, Krishnendu Chakrabarty
2019 J jnl
A Design-for-Test Solution Based on Dedicated Test Layers and Test Scheduling for Monolithic 3-D Integrated Circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty
2019 Misc conf
Reliable Power Delivery and Analysis of Power-Supply Noise During Testing in Monolithic 3D ICs.
VTS
Abhishek Koneru, Aida Todri-Sanial, Krishnendu Chakrabarty
2019 — conf
Test and Design-for-Testability Solutions for Monolithic 3D Integrated Circuits.
ACM Great Lakes Symposium on VLSI
Abhishek Koneru, Krishnendu Chakrabarty
2018 Misc conf
An inter-layer interconnect BIST solution for monolithic 3D ICs.
VTS
Abhishek Koneru, Krishnendu Chakrabarty
2018 J jnl
Fine-Grained Aging-Induced Delay Prediction Based on the Monitoring of Run-Time Stress.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Arunkumar Vijayan, Abhishek Koneru, Saman Kiamehr, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
2018 — conf
Power-Supply Noise Analysis for Monolithic 3D ICs Using Electrical and Thermal Co-Simulation.
ICECS
Abhishek Koneru, Aida Todri-Sanial, Krishnendu Chakrabarty
2017 C conf
A Design-for-Test Solution for Monolithic 3D Integrated Circuits.
ICCD
Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty
2017 A conf
Design automation and testing of monolithic 3D ICs: Opportunities, challenges, and solutions: (Invited paper).
ICCAD
Kyungwook Chang, Abhishek Koneru, Krishnendu Chakrabarty, Sung Kyu Lim
2017 J jnl
Impact of Electrostatic Coupling and Wafer-Bonding Defects on Delay Testing of Monolithic 3D Integrated Circuits.
ACM J. Emerg. Technol. Comput. Syst.
Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty
2016 B conf
Analysis of electrostatic coupling in monolithic 3D integrated circuits and its impact on delay testing.
ETS
Abhishek Koneru, Krishnendu Chakrabarty
2016 Misc conf
Online soft-error vulnerability estimation for memory arrays.
VTS
Arunkumar Vijayan, Abhishek Koneru, Mojtaba Ebrahimi, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
2015 J jnl
Accurate Analysis and Prediction of Enterprise Service-Level Performance.
ACM Trans. Design Autom. Electr. Syst.
Qing Duan, Abhishek Koneru, Jun Zeng, Krishnendu Chakrabarty, Gary Dispoto
2015 A conf
Fine-Grained Aging Prediction Based on the Monitoring of Run-Time Stress Using DfT Infrastructure.
ICCAD
Abhishek Koneru, Arunkumar Vijayan, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
2015 B conf
Re-using BIST for circuit aging monitoring.
ETS
Farshad Firouzi, Fangming Ye, Arunkumar Vijayan, Abhishek Koneru, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori
2015 C conf
Self-awareness and self-learning for resiliency in real-time systems.
IOLTS
Mehdi Baradaran Tahoori, Abhijit Chatterjee, Krishnendu Chakrabarty, Abhishek Koneru, Arunkumar Vijayan, Debashis Banerjee