Abhijit Chatterjee

461 papers A* 8A 74B 24C 51Misc 91Journal 124Unranked 87

Year	Rank	Type	Title / Venue / Authors
2026	J	`jnl`	DANCE: Dynamic 3D CNN Pruning: Joint Frame, Channel, and Feature Adaptation for Energy Efficiency on the Edge. CoRR Mohamed Mejri, Ashiqur Rasul, Abhijit Chatterjee
2026	J	`jnl`	RESOLVE: Reasoning in Hyperdimensional Spaces With Relational and Object Level Features Using Vector Symbolic Processing. IEEE Access Mohamed Mejri, Chandramouli N. Amarnath, Abhijit Chatterjee
2025	C	`conf`	Adaptive Testing of Compute-in-Memory Based CNNs Using Probabilistic Test Acceptance Limits. IOLTS Anurup Saha, Kwondo Ma, Chandramouli N. Amarnath, Moinuddin Qureshi, Abhijit Chatterjee
2025	J	`jnl`	An Area-Efficient with High-Dynamic Range Readout Circuit for Resistive Gas Sensors. J. Circuits Syst. Comput. Jagadish Rajpoot, Prem Manglam, Abhijit Chatterjee, Upamannu Sen, Parul Singh, Shivam Verma
2025	B	`conf`	Confidence Driven Compact Testing of Compute-in-Memory Based Language Models. ETS Anurup Saha, Chandramouli N. Amarnath, Kwondo Ma, Abhijit Chatterjee
2025	A	`conf`	EGIS: Entropy Guided Image Synthesis for Dataset-Agnostic Testing of RRAM-Based DNNs. DATE Anurup Saha, Chandramouli N. Amarnath, Kwondo Ma, Abhijit Chatterjee
2025	A	`conf`	Efficient Delay Fault Characterization of Resistive Open Defects in Standard Cells Using Resistive Fault Dominance. ITC Gowsika Dharmaraj, Abhijit Chatterjee, Adit D. Singh, Arani Sinha
2025	J	`jnl`	Efficient Parallel Testing and Implicit Cost-Driven Tuning of RF-MIMO Systems. IEEE Trans. Very Large Scale Integr. Syst. Suhasini Komarraju, Sabyasachi Deyati, Abhijit Chatterjee
2025	J	`jnl`	Energy-Efficient Domain-Specific Artificial Intelligence Models and Agents: Pathways and Paradigms. CoRR Abhijit Chatterjee, Niraj K. Jha, Jonathan D. Cohen, Thomas L. Griffiths, Hongjing Lu, Diana Marculescu, Ashiqur Rasul, Keshab K. Parhi
2025	J	`jnl`	Error Resilient Online Reinforcement Learning Using Adaptive Statistical Checks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Chandramouli N. Amarnath, Mohamed Mejri, Jackson Isenberg, Abhijit Chatterjee
2025	B	`conf`	European Test Symposium Teams: an Anniversary Snapshot. ETS Maksim Jenihhin, Jaan Raik, Artur Jutman, Natalia Cherezova, Raimund Ubar, Liviu Miclea, Szilárd Enyedi, I. Stefan, Ovidiu Stan, Cosmina Corches, Z. Peng, Petru Eles, Rolf Drechsler, S. Eggersglüß, Görschwin Fey, Andreas Glowatz, Daniel Tille, Georges G. E. Gielen, Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, P.-Y. Chuang, Erik Jan Marinissen, Giorgio Di Natale, M. Barragan, Paolo Maistri, S. Mir, Vatajelu I. Vatajelu, Paolo Bernardi, S. Di Carlo, Paolo Prinetto, Matteo Sonza Reorda, Massimo Violante, Haralampos-G. Stratigopoulos, M. K. Michael, Stelios Neophytou, Stavros Hadjitheophanous, Kyriakos Christou, M. Skitsas, Alberto Bosio, Bastien Deveautour, P. Girard, Marcello Traiola, Arnaud Virazel, F. Fernandes Dos Santos, Angeliki Kritikakou, Gioele Casagranda, Marzio Vallero, Flavio Vella, Paolo Rech, Letícia Maria Bolzani Poehls, Milos Krstic, Marko S. Andjelkovic, F. Vargas, Grigor Tshagharyan, Gurgen Harutyunyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Mottaqiallah Taouil, Moritz Fieback, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Abhijit Chatterjee, A. Saha, Suhasini Komarraju, K. Ma, Chandramouli N. Amarnath, Mehdi Baradaran Tahoori, Mahta Mayahinia, Maryam Rajabalipanah, Katayoon Basharkhah, N. Nosrati, Zahra Jahanpeima, Zain Navabi, Hans-Joachim Wunderlich, Sybille Hellebrand
2025	J	`jnl`	Gaussian Process Implicit Surfaces as Control Barrier Functions for Safe Robot Navigation. CoRR Mouhyemen Khan, Tatsuya Ibuki, Abhijit Chatterjee
2025	J	`jnl`	OATT: Outlier-Oriented Alternative Testing and Post-Manufacture Tuning of Analog/Mixed-Signal Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Suhasini Komarraju, Akhil Tammana, Chandramouli N. Amarnath, Abhijit Chatterjee
2025	—	`conf`	On-the-Fly Machine Learning Interatomic Potential for Bulk PdH: Assessing Accuracy and Efficiency. HiPCW Poonam Parkar, Sudarshan Vijay, Abhijit Chatterjee
2025	J	`jnl`	SiPT: Signature-Based Predictive Testing of RRAM Crossbar Arrays for Deep Neural Networks. IEEE Trans. Emerg. Top. Comput. Kwondo Ma, Anurup Saha, Chandramouli N. Amarnath, Abhijit Chatterjee
2025	J	`jnl`	eCAV: An Edge-Assisted Evaluation Platform for Connected Autonomous Vehicles. CoRR Tyler C. Landle, Jordan Rapp, Dean Blank, Chandramouli N. Amarnath, Abhijit Chatterjee, Alexandros Daglis, Umakishore Ramachandran
2024	J	`jnl`	A Novel Hyperdimensional Computing Framework for Online Time Series Forecasting on the Edge. CoRR Mohamed Mejri, Chandramouli N. Amarnath, Abhijit Chatterjee
2024	—	`conf`	ADARE-HD: Adaptive-Resolution Framework for Efficient Object Detection and Tracking via HD-Computing. MWSCAS Mohamed Mejri, Chandramouli N. Amarnath, Abhijit Chatterjee
2024	B	`conf`	AMS Test Stimulus Generation and Response Analysis Using Hyperdimensional Clustering: Minimizing Misclassification Rate. ETS Suhasini Komarraju, Mohamed Mejri, Akhil Tammana, Gowsika Dharmaraj, Chandramouli N. Amarnath, Abhijit Chatterjee
2024	—	`conf`	DeepER-HD: An Error Resilient HyperDimensional Computing Framework with DNN Front-End for Feature Selection. LATS Mohamed Mejri, Chandramouli N. Amarnath, Abhijit Chatterjee
2024	C	`conf`	Efficient Optimized Testing of Resistive RAM Based Convolutional Neural Networks. IOLTS Anurup Saha, Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee
2024	J	`jnl`	Error Resilience in Deep Neural Networks Using Neuron Gradient Statistics. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Chandramouli N. Amarnath, Mohamed Mejri, Kwondo Ma, Abhijit Chatterjee
2024	Misc	`conf`	Error Resilient Hyperdimensional Computing Using Hypervector Encoding and Cross-Clustering. VTS Mohamed Mejri, Chandramouli N. Amarnath, Abhijit Chatterjee
2024	J	`jnl`	LARS-VSA: A Vector Symbolic Architecture For Learning with Abstract Rules. CoRR Mohamed Mejri, Chandramouli N. Amarnath, Abhijit Chatterjee
2024	A	`conf`	Learning Assisted Post-Manufacture Testing and Tuning of RRAM-Based DNNs for Yield Recovery. DATE Kwondo Ma, Anurup Saha, Chandramouli N. Amarnath, Abhijit Chatterjee
2024	B	`conf`	Post-Manufacture Criticality-Aware Gain Tuning of Timing Encoded Spiking Neural Networks for Yield Recovery. ETS Anurup Saha, Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee
2024	J	`jnl`	RESOLVE: Relational Reasoning with Symbolic and Object-Level Features Using Vector Symbolic Processing. CoRR Mohamed Mejri, Chandramouli N. Amarnath, Abhijit Chatterjee
2024	B	`conf`	Signature Driven Post-Manufacture Testing and Tuning of RRAM Spiking Neural Networks for Yield Recovery. ASPDAC Anurup Saha, Chandramouli N. Amarnath, Kwondo Ma, Abhijit Chatterjee
2024	A	`conf`	TEACH: Outlier Oriented Testing of Analog/Mixed-Signal Circuits Using One-class Hyperdimensional Clustering. ITC Suhasini Komarraju, Mohamed Mejri, Abhijit Chatterjee, Suriyaprakash Natarajan, Prashant Goteti
2024	—	`conf`	Testing and Tuning of RRAM-Based DNNs: A Machine Learning-Assisted Approach. MWSCAS Kwondo Ma, Anurup Saha, Suhasini Komarraju, Chandramouli N. Amarnath, Abhijit Chatterjee
2024	—	`conf`	Towards Self-Organisation in Multi-Task Scheduling for Multi-Satellite Missions. ACSOS-C Abhijit Chatterjee, Aishwaryaprajna
2023	C	`conf`	A Novel Approach to Error Resilience in Online Reinforcement Learning. IOLTS Chandramouli N. Amarnath, Abhijit Chatterjee
2023	B	`conf`	A Resilience Framework for Synapse Weight Errors and Firing Threshold Perturbations in RRAM Spiking Neural Networks. ETS Anurup Saha, Chandramouli N. Amarnath, Abhijit Chatterjee
2023	J	`jnl`	Accelerated calculation of configurational free energy using a combination of reverse Monte Carlo and neural network models: Adsorption isotherm for 2D square and triangular lattices. Comput. Phys. Commun. Akash Kumar Ball, Swati Rana, Gargi Agrahari, Abhijit Chatterjee
2023	J	`jnl`	BISCC: A Novel Approach to Built In State Consistency Checking For Quick Volume Validation of Mixed-Signal/RF Systems. J. Electron. Test. Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee
2023	—	`conf`	Error Resilient Neuromorphic Systems Using Embedded Predictive Neuron Checks. LATS Chandramouli N. Amarnath, Abhijit Chatterjee
2023	B	`conf`	Error Resilient Transformers: A Novel Soft Error Vulnerability Guided Approach to Error Checking and Suppression. ETS Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee
2023	A	`conf`	OATT: Outlier Oriented Alternative Testing and Post-Manufacture Tuning of Mixed-Signal/RF Circuits and Systems. ITC Suhasini Komarraju, Akhil Tammana, Chandramouli N. Amarnath, Abhijit Chatterjee
2023	—	`conf`	Secure Control Loop Execution of Cyber-Physical Devices Using Predictive State Space Checks. ISQED Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee, Jacob A. Abraham
2022	—	`conf`	Development of Smart Sensor for IoT Based Environmental Data Analysis Through Edge Computing. COMS2 Abhijit Chatterjee
2022	J	`jnl`	Effects of Measurement Uncertainties on Multitarget Tracking. IEEE Instrum. Meas. Mag. Abhijit Chatterjee, Ratnasingham Tharmarasa
2022	A	`conf`	Efficient Low Cost Alternative Testing of Analog Crossbar Arrays for Deep Neural Networks. ITC Kwondo Ma, Anurup Saha, Chandramouli N. Amarnath, Abhijit Chatterjee
2022	J	`jnl`	Gaussian Control Barrier Functions : A Non-Parametric Paradigm to Safety. CoRR Mouhyemen Khan, Tatsuya Ibuki, Abhijit Chatterjee
2022	J	`jnl`	Gaussian Control Barrier Functions: Non-Parametric Paradigm to Safety. IEEE Access Mouhyemen Khan, Tatsuya Ibuki, Abhijit Chatterjee
2022	—	`conf`	Low Power Neural Network Accelerators Using Collaborative Weight Tuning and Shared Shift-Add optimization. MWSCAS Kwondo Ma, Mohamed Mejri, Chandramouli N. Amarnath, Abhijit Chatterjee
2022	A	`conf`	ML-Assisted Bug Emulation Experiments for Post-Silicon Multi-Debug of AMS Circuits. ITC Jun-Yang Lei, Abhijit Chatterjee
2022	—	`conf`	Reinforcement Learning Based Power-Optimal Usage of Beamforming Antenna Array for Multi-Way Wireless Communication in Vehicular Traffic Environments. MWSCAS Suhasini Komarraju, Abhijit Chatterjee
2022	J	`jnl`	Reward Factor-Based Multiple Agile Satellites Scheduling With Energy and Memory Constraints. IEEE Trans. Aerosp. Electron. Syst. Abhijit Chatterjee, Ratnasingham Tharmarasa
2022	A	`conf`	Self-Aware MIMO Beamforming Systems: Dynamic Adaptation to Channel Conditions and Manufacturing Variability. DATE Suhasini Komarraju, Abhijit Chatterjee
2022	C	`conf`	Soft Error Resilient Deep Learning Systems Using Neuron Gradient Statistics. IOLTS Chandramouli N. Amarnath, Mohamed Mejri, Kwondo Ma, Abhijit Chatterjee
2022	J	`jnl`	TPMD toolkit: A toolkit for studying rate processes using molecular dynamics trajectories and performing temperature programmed molecular dynamics calculations. Comput. Phys. Commun. Saurabh Shivpuje, Abhijit Chatterjee
2021	C	`conf`	Addressing Soft Error and Security Threats in DNNs Using Learning Driven Algorithmic Checks. IOLTS Chandramouli N. Amarnath, Md Imran Momtaz, Abhijit Chatterjee
2021	J	`jnl`	An algorithm for estimating kinetic parameters of atomistic rare events using finite-time temperature programmed molecular dynamics trajectories. Comput. Phys. Commun. Saurabh Shivpuje, Manish Kumawat, Abhijit Chatterjee
2021	—	`conf`	Automatic Surrogate Model Generation and Debugging of Analog/Mixed-Signal Designs Via Collaborative Stimulus Generation and Machine Learning. ASP-DAC Jun-Yang Lei, Abhijit Chatterjee
2021	A	`conf`	Hierarchical Failure Modeling and Machine Learning Assisted Correction of Electro-Mechanical Subsystem Failures in Autonomous Vehicles. ITC Chandramouli N. Amarnath, Md Imran Momtaz, Abhijit Chatterjee
2021	J	`jnl`	High Resolution Pulse Propagation Driven Trojan Detection in Digital Systems. J. Electron. Test. Sabyasachi Deyati, Barry J. Muldrey, Adit D. Singh, Abhijit Chatterjee
2021	C	`conf`	Online Fast Detection and Diagnosis of Power Grid Security Attacks Using State Checksums. IOLTS Suvadeep Banerjee, Abhijit Chatterjee
2021	J	`jnl`	Real-Time Error Detection in Nonlinear Control Systems Using Machine Learning Assisted State-Space Encoding. IEEE Trans. Dependable Secur. Comput. Suvadeep Banerjee, Balavinayagam Samynathan, Jacob A. Abraham, Abhijit Chatterjee
2021	A*	`conf`	Safety Uncertainty in Control Barrier Functions using Gaussian Processes. ICRA Mouhyemen Khan, Tatsuya Ibuki, Abhijit Chatterjee
2021	J	`jnl`	TESDA: Transform Enabled Statistical Detection of Attacks in Deep Neural Networks. CoRR Chandramouli N. Amarnath, Aishwarya H. Balwani, Kwondo Ma, Abhijit Chatterjee
2021	Misc	`conf`	Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts. VTS Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee
2021	J	`jnl`	eCloud: A Vision for the Evolution of the Edge-Cloud Continuum. Computer Joy Arulraj, Abhijit Chatterjee, Alexandros Daglis, Ashutosh Dhekne, Umakishore Ramachandran
2020	C	`conf`	Barrier Functions in Cascaded Controller: Safe Quadrotor Control. ACC Mouhyemen Khan, Munzir Zafar, Abhijit Chatterjee
2020	A	`conf`	Concurrent Error Detection in Embedded Digital Control of Nonlinear Autonomous Systems Using Adaptive State Space Checks. ITC Md Imran Momtaz, Chandramouli N. Amarnath, Abhijit Chatterjee
2020	A*	`conf`	Diagnosing Software Faults Using Multiverse Analysis. IJCAI Prantik Chatterjee, Abhijit Chatterjee, José Campos, Rui Abreu, Subhajit Roy
2020	J	`jnl`	Diagnosis and Compensation of Control Program, Sensor and Actuator Failures in Nonlinear Systems Using Hierarchical State Space Checks. J. Electron. Test. Md Imran Momtaz, Abhijit Chatterjee
2020	J	`jnl`	Dynamic Test Stimulus Adaptation for Analog/RF Circuits Using Booleanized Models Extracted From Hardware. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Sabyasachi Deyati, Barry J. Muldrey, Abhijit Chatterjee
2020	C	`conf`	Encoded Check Driven Concurrent Error Detection in Particle Filters for Nonlinear State Estimation. IOLTS Chandramouli N. Amarnath, Md Imran Momtaz, Abhijit Chatterjee
2020	A	`conf`	Fast EVM Tuning of MIMO Wireless Systems Using Collaborative Parallel Testing and Implicit Reward Driven Learning. ITC Suhasini Komarraju, Abhijit Chatterjee
2020	—	`conf`	Gaussian Control Barrier Functions: Safe Learning and Control. CDC Mouhyemen Khan, Abhijit Chatterjee
2020	A	`conf`	Multi-Sparse Gaussian Process: Learning based Semi-Parametric Control. IROS Mouhyemen Khan, Akash Patel, Abhijit Chatterjee
2020	J	`jnl`	Multi-Sparse Gaussian Process: Learning based Semi-Parametric Control. CoRR Mouhyemen Khan, Akash Patel, Abhijit Chatterjee
2020	J	`jnl`	Online Parameter Estimation for Safety-Critical Systems with Gaussian Processes. CoRR Mouhyemen Khan, Abhijit Chatterjee
2020	A	`conf`	SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts. ITC Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee
2019	J	`jnl`	ALERA: Accelerated Reinforcement Learning Driven Adaptation to Electro-Mechanical Degradation in Nonlinear Control Systems Using Encoded State Space Error Signatures. ACM Trans. Intell. Syst. Technol. Suvadeep Banerjee, Abhijit Chatterjee
2019	J	`jnl`	Barrier Functions in Cascaded Controller: Safe Quadrotor Control. CoRR Mouhyemen Khan, Munzir Zafar, Abhijit Chatterjee
2019	A	`conf`	Characterization of Library Cells for Open-circuit Defect Exposure: A Systematic Methodology. ITC Sujay Pandey, Sanya Gupta, Madhu Sudhan L., Suriya Natarajan, Arani Sinha, Abhijit Chatterjee
2019	C	`conf`	Closed-Loop Multi-Satellite Scheduling Based on Hierarchical MDP. FUSION Ratnasingham Tharmarasa, Abhijit Chatterjee, Yinghui Wang, Thia Kirubarajan, Jean Berger, Mihai Cristian Florea
2019	J	`jnl`	Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal Acquisition. J. Electron. Test. Thomas Moon, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee
2019	C	`conf`	Hierarchical Check Based Detection and Diagnosis of Sensor-Actuator Malfunction in Autonomous Systems: A Quadcopter Study. IOLTS Md Imran Momtaz, Abhijit Chatterjee
2019	—	`conf`	Hierarchical State Space Checks for Errors in Sensors, Actuators and Control of Nonlinear Systems: Diagnosis and Compensation. ATS Md Imran Momtaz, Abhijit Chatterjee
2019	Misc	`conf`	Mixed Signal Design Validation Using Reinforcement Learning Guided Stimulus Generation for Behavior Discovery. VTS Barry John Muldrey, Suvadeep Banerjee, Abhijit Chatterjee
2018	—	`conf`	A Monobit Built-In Test and Diagnostic System for Flexible Electronic Interconnect. ATS Jun-Yang Lei, Thomas Moon, Justin Chow, Suresh K. Sitaraman, Abhijit Chatterjee
2018	J	`jnl`	Content-Aware Low-Complexity Object Detection for Tracking Using Adaptive Compressed Sensing. IEEE J. Emerg. Sel. Topics Circuits Syst. Joshua W. Wells, Abhijit Chatterjee
2018	C	`conf`	Cross-Layer Control Adaptation for Autonomous System Resilience. IOLTS Md Imran Momtaz, Suvadeep Banerjee, Sujay Pandey, Jacob A. Abraham, Abhijit Chatterjee
2018	B	`conf`	Device aging: A reliability and security concern. ETS Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi
2018	C	`conf`	Error Resilient Neuromorphic Networks Using Checker Neurons. IOLTS Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee
2018	—	`conf`	Exploiting power supply ramp rate for calibrating cell strength in SRAM PUFs. LATS Wendong Wang, Adit D. Singh, Ujjwal Guin, Abhijit Chatterjee
2018	B	`conf`	ReiNN: Efficient error resilience in artificial neural networks using encoded consistency checks. ETS Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee
2017	A	`conf`	BISCC: Efficient pre through post silicon validation of mixed-signal/RF systems using built in state consistency checking. DATE Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee
2017	A	`conf`	Concurrent built in test and tuning of beamforming MIMO systems using learning assisted performance optimization. ITC Sabyasachi Deyati, Barry J. Muldrey, Byunghoo Jung, Abhijit Chatterjee
2017	C	`conf`	Design of efficient error resilience in signal processing and control systems: From algorithms to circuits. IOLTS Jacob A. Abraham, Suvadeep Banerjee, Abhijit Chatterjee
2017	J	`jnl`	Error-Resilient Video Encoding Using Parallel Independent Signature Processing. IEEE Trans. Circuits Syst. Video Technol. Joshua W. Wells, Abhijit Chatterjee
2017	Misc	`conf`	On-line diagnosis and compensation for parametric failures in linear state variable circuits and systems using time-domain checksum observers. VTS Md Imran Momtaz, Suvadeep Banerjee, Abhijit Chatterjee
2017	Misc	`conf`	Post-Silicon Validation: Automatic Characterization of RF Device Nonidealities via Iterative Learning Experiments on Hardware. VLSID Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee
2017	C	`conf`	Probabilistic error detection and correction in switched capacitor circuits using checksum codes. IOLTS Md Imran Momtaz, Suvadeep Banerjee, Abhijit Chatterjee
2017	B	`conf`	Real-time self-learning for control law adaptation in nonlinear systems using encoded check states. ETS Suvadeep Banerjee, Abhijit Chatterjee
2017	J	`jnl`	Self-Learning RF Receiver Systems: Process Aware Real-Time Adaptation to Channel Conditions for Low Power Operation. IEEE Trans. Circuits Syst. I Regul. Pap. Debashis Banerjee, Barry John Muldrey, Xian Wang, Shreyas Sen, Abhijit Chatterjee
2016	Misc	`conf`	Adaptive testing of analog/RF circuits using hardware extracted FSM models. VTS Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee
2016	—	`conf`	Checksum based error detection in linearized representations of non linear control systems. LATS Suvadeep Banerjee, Abhijit Chatterjee, Jacob A. Abraham
2016	J	`jnl`	Concurrent Multi-Channel Crosstalk Jitter Characterization Using Coprime Period Channel Stimulus. IEEE Trans. Circuits Syst. I Regul. Pap. Nicholas Tzou, Debesh Bhatta, Xian Wang, Te-Hui Chen, Sen-Wen Hsiao, Barry J. Muldrey, Hyun Woo Choi, Abhijit Chatterjee
2016	—	`conf`	Concurrent Stimulus and Defect Magnitude Optimization for Detection of Weakest Shorts and Opens in Analog Circuits. ATS Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee
2016	C	`conf`	Concurrent error detection and tolerance in Kalman filters using encoded state and statistical covariance checks. IOLTS Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee
2016	A	`conf`	DE-LOC: Design validation and debugging under limited observation and control, pre- and post-silicon for mixed-signal systems. ITC Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee
2016	Misc	`conf`	Design of Self Calibrating and Error Resilient Mixed-Signal Systems for Signal Processing, Communications and Control. VLSID Jacob A. Abraham, Abhijit Chatterjee
2016	J	`jnl`	Digitally Assisted Built-In Tuning Using Hamming Distance Proportional Signatures in RF Circuits. IEEE Trans. Very Large Scale Integr. Syst. Shyam Kumar Devarakond, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee
2016	A	`conf`	Efficient cross-layer concurrent error detection in nonlinear control systems using mapped predictive check states. ITC Suvadeep Banerjee, Abhijit Chatterjee, Jacob A. Abraham
2016	—	`conf`	Noise-Resilient SRAM Physically Unclonable Function Design for Security. ATS Sujay Pandey, Sabyasachi Deyati, Adit D. Singh, Abhijit Chatterjee
2016	Misc	`conf`	Real-time DC motor error detection and control compensation using linear checksums. VTS Md Imran Momtaz, Suvadeep Banerjee, Abhijit Chatterjee
2016	Misc	`conf`	TRAP: Test Generation Driven Classification of Analog/RF ICs Using Adaptive Probabilistic Clustering Algorithm. VLSID Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee
2016	—	`conf`	Trojan detection in digital systems using current sensing of pulse propagation in logic gates. ISQED Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee
2015	—	`conf`	"Safe" built-in test and tuning of boost converters using feedback loop perturbations. LATS Xian Wang, Kenfack Blanchard, Estella Silva, Abhijit Chatterjee
2015	Misc	`conf`	A Noise Aware CML Latch Modelling for Large System Simulation. VLSID Debesh Bhatta, Suvadeep Banerjee, Abhijit Chatterjee
2015	B	`conf`	An FPGA-based ATE extension module for low-cost multi-GHz memory test. ETS David C. Keezer, Te-Hui Chen, Thomas Moon, D. T. Stonecypher, Abhijit Chatterjee, Hyun Woo Choi, Sungyeol Kim, Hosun Yoo
2015	J	`jnl`	Automatic Test Stimulus Generation for Diagnosis of RF Transceivers Using Model Parameter Estimation. IEEE Trans. Very Large Scale Integr. Syst. Aritra Banerjee, Abhijit Chatterjee
2015	—	`conf`	Challenge Engineering and Design of Analog Push Pull Amplifier Based Physically Unclonable Function for Hardware Security. ATS Sabyasachi Deyati, Barry John Muldrey, Adit D. Singh, Abhijit Chatterjee
2015	C	`conf`	Concurrent error detection in nonlinear digital filters using checksum linearization and residue prediction. IOLTS Suvadeep Banerjee, Md Imran Momtaz, Abhijit Chatterjee
2015	J	`jnl`	Incoherent Undersampling-Based Waveform Reconstruction Using a Time-Domain Zero-Crossing Metric. IEEE Trans. Very Large Scale Integr. Syst. Debesh Bhatta, Nicholas Tzou, Joshua W. Wells, Sen-Wen Hsiao, Abhijit Chatterjee
2015	J	`jnl`	Low Cost Sparse Multiband Signal Characterization Using Asynchronous Multi-Rate Sampling: Algorithms and Hardware. J. Electron. Test. Nicholas Tzou, Debesh Bhatta, Barry J. Muldrey, Thomas Moon, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee
2015	Misc	`conf`	Low cost high frequency signal synthesis: Application to RF channel interference testing. VTS Xian Wang, Debashis Banerjee, Abhijit Chatterjee
2015	J	`jnl`	Real-Time Use-Aware Adaptive RF Transceiver Systems for Energy Efficiency Under BER Constraints. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Debashis Banerjee, Shyam Kumar Devarakond, Xian Wang, Shreyas Sen, Abhijit Chatterjee
2015	A	`conf`	Self Learning Analog/Mixed-Signal/RF Systems: Dynamic Adaptation to Workload and Environmental Uncertainties. ICCAD Debashis Banerjee, Shreyas Sen, Abhijit Chatterjee
2015	C	`conf`	Self-awareness and self-learning for resiliency in real-time systems. IOLTS Mehdi Baradaran Tahoori, Abhijit Chatterjee, Krishnendu Chakrabarty, Abhishek Koneru, Arunkumar Vijayan, Debashis Banerjee
2015	J	`jnl`	Signature Driven Hierarchical Post-Manufacture Tuning of RF Systems for Performance and Power. IEEE Trans. Very Large Scale Integr. Syst. Aritra Banerjee, Abhijit Chatterjee
2015	Misc	`conf`	Tutorial T3: Error Resilient Real-Time Embedded Systems: Computing, Communications and Control. VLSID Jacob A. Abraham, Abhijit Chatterjee
2015	J	`jnl`	Wideband Sparse Signal Acquisition With Dual-rate Time-Interleaved Undersampling Hardware and Multicoset Signal Reconstruction Algorithms. IEEE Trans. Signal Process. Thomas Moon, Hyun Woo Choi, Nicholas Tzou, Abhijit Chatterjee
2015	J	`jnl`	Yield Recovery of RF Transceiver Systems Using Iterative Tuning-Driven Power-Conscious Performance Optimization. IEEE Des. Test Vishwanath Natarajan, Aritra Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee
2014	—	`conf`	3D-ICs with self-healing capability for thermal effects in RF circuits. ISQED Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee
2014	A	`conf`	A self-tuning architecture for buck converters based on alternative test. ITC Xian Wang, Blanchard Kenfack, Estella Silva, Abhijit Chatterjee
2014	Misc	`conf`	Alternative "safe" test of hysteretic power converters. VTS Xian Wang, Blanchard Kenfack, Estella Silva, Abhijit Chatterjee
2014	Misc	`conf`	Atomic model learning: A machine learning paradigm for post silicon debug of RF/analog circuits. VTS Sabyasachi Deyati, Barry John Muldrey, Aritra Banerjee, Abhijit Chatterjee
2014	B	`conf`	Design of low cost fault tolerant analog circuits using real-time learned error compensation. ETS Suvadeep Banerjee, Álvaro Gómez-Pau, Abhijit Chatterjee
2014	—	`conf`	Error Resilient Real-Time State Variable Systems for Signal Processing and Control. ATS Suvadeep Banerjee, Álvaro Gómez-Pau, Abhijit Chatterjee, Jacob A. Abraham
2014	—	`conf`	High Resolution Pulse Propagation Driven Trojan Detection in Digital Logic: Optimization Algorithms and Infrastructure. ATS Sabyasachi Deyati, Barry John Muldrey, Adit D. Singh, Abhijit Chatterjee
2014	J	`jnl`	Low Cost Built-in Sensor Testing of Phase-Locked Loop Dynamic Parameters. J. Electron. Test. Sen-Wen Hsiao, Xian Wang, Abhijit Chatterjee
2014	J	`jnl`	Low Cost Signal Reconstruction Based Testing of RF Components using Incoherent Undersampling. J. Electron. Test. Debesh Bhatta, Aritra Banerjee, Sabyasachi Deyati, Nicholas Tzou, Abhijit Chatterjee
2014	A	`conf`	Low cost back end signal processing driven bandwidth interleaved signal acquisition using free running undersampling clocks and mixing signals. ITC Nicholas Tzou, Debesh Bhatta, Abhijit Chatterjee
2014	Misc	`conf`	Multi-channel testing architecture for high-speed eye-diagram using pin electronics and subsampling monobit reconstruction algorithms. VTS Thomas Moon, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee
2014	Misc	`conf`	Phase-locked loop design with SPO detection and charge pump trimming for reference spur suppression. VTS Sen-Wen Hsiao, Chung-Chun Chen, Randy Caplan, Jeff Galloway, Blake Gray, Abhijit Chatterjee
2014	J	`jnl`	Process-Variation Tolerant Channel-Adaptive Virtually Zero-Margin Low-Power Wireless Receiver Systems. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Shreyas Sen, Vishwanath Natarajan, Shyam Kumar Devarakond, Abhijit Chatterjee
2014	C	`conf`	Real-time transient error and induced noise cancellation in linear analog filters using learning-assisted adaptive analog checksums. IOLTS Álvaro Gómez-Pau, Suvadeep Banerjee, Abhijit Chatterjee
2014	A	`conf`	Self-learning MIMO-RF receiver systems: process resilient real-time adaptation to channel conditions for low power operation. ICCAD Debashis Banerjee, Barry John Muldrey, Shreyas Sen, Xian Wang, Abhijit Chatterjee
2014	J	`jnl`	Timing Noise Characterization of High-Speed Digital Bit Sequences Using Incoherent Subsampling and Algorithmic Clock Recovery. IEEE Trans. Instrum. Meas. Hyun Woo Choi, Thomas Moon, Abhijit Chatterjee
2014	Misc	`conf`	Timing Variation Adaptive Pipeline Design: Using Probabilistic Activity Completion Sensing with Backup Error Resilience. VLSID Jayaram Natarajan, Sahil Kapoor, Debesh Bhatta, Abhijit Chatterjee, Adit D. Singh
2013	Misc	`conf`	A High Throughput Multiplier Design Exploiting Input Based Statistical Distribution in Completion Delays. VLSI Design Ravi Tej Uppu, Ravi Kanth Uppu, Adit D. Singh, Abhijit Chatterjee
2013	J	`jnl`	A cluster expansion model for predicting activation barrier of atomic processes. J. Comput. Phys. Tafizur Rehman, M. Jaipal, Abhijit Chatterjee
2013	Misc	`conf`	A programmable BIST design for PLL static phase offset estimation and clock duty cycle detection. VTS Sen-Wen Hsiao, Nicholas Tzou, Abhijit Chatterjee
2013	—	`conf`	Adaptive MIMO RF systems: Post-manufacture and real-time tuning for performance maximization and power minimization. MWSCAS Debashis Banerjee, Aritra Banerjee, Shyam Kumar Devarakond, Abhijit Chatterjee
2013	Misc	`conf`	Adaptive RF Front-end Design via Self-discovery: Using Real-time Data to Optimize Adaptation Control. VLSI Design Debashis Banerjee, Aritra Banerjee, Abhijit Chatterjee
2013	C	`conf`	An adaptive class-E power amplifier with improvement in efficiency, reliability and process variation tolerance. ISCAS Aritra Banerjee, Abhijit Chatterjee
2013	—	`conf`	Analog Sensor Based Testing of Phase-Locked Loop Dynamic Performance Parameters. Asian Test Symposium Sen-Wen Hsiao, Xian Wang, Abhijit Chatterjee
2013	—	`conf`	Built-In Test of Switched-Mode Power Converters: Avoiding DUT Damage Using Alternative Safe Measurements. Asian Test Symposium Xian Wang, Blanchard Kenfack, Estella Silva, Abhijit Chatterjee
2013	J	`jnl`	Dynamic Specification Testing and Diagnosis of High-Precision Sigma-Delta ADCs. IEEE Des. Test Sehun Kook, Aritra Banerjee, Abhijit Chatterjee
2013	B	`conf`	Efficient system-level testing and adaptive tuning of MIMO-OFDM wireless transmitters. ETS Shyam Kumar Devarakond, Debashis Banerjee, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee
2013	C	`conf`	Embedded tutorials: Embedded tutorial 1: Cell-aware test-from gates to transistors. VLSI-SoC Janusz Rajski, Miodrag Potkonjak, Adit D. Singh, Abhijit Chatterjee, Zain Navabi, Matthew R. Guthaus, Sezer Gören
2013	—	`conf`	Enhanced Resolution Time-Domain Reflectometry for High Speed Channels: Characterizing Spatial Discontinuities with Non-ideal Stimulus. Asian Test Symposium Suvadeep Banerjee, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee
2013	—	`conf`	Low cost signal reconstruction based testing of RF components using incoherent undersampling. LATW Debesh Bhatta, Aritra Banerjee, Sabyasachi Deyati, Nicholas Tzou, Abhijit Chatterjee
2013	J	`jnl`	Low-Resolution DAC-Driven Linearity Testing of Higher Resolution ADCs Using Polynomial Fitting Measurements. IEEE Trans. Very Large Scale Integr. Syst. Sehun Kook, Hyun Woo Choi, Abhijit Chatterjee
2013	Misc	`conf`	Low-cost multi-channel testing of periodic signals using monobit receivers and incoherent subsampling. VTS Thomas Moon, Hyun Woo Choi, Abhijit Chatterjee
2013	A	`conf`	Periodic jitter and bounded uncorrelated jitter decomposition using incoherent undersampling. DATE Nicholas Tzou, Debesh Bhatta, Sen-Wen Hsiao, Abhijit Chatterjee
2013	—	`conf`	Predicting die-level process variations from wafer test data for analog devices: A feasibility study. LATW Shyam Kumar Devarakond, Jennifer McCoy, Amit Nahar, John M. Carulli Jr., Soumendu Bhattacharya, Abhijit Chatterjee
2013	Misc	`conf`	RAVAGE: Post-silicon validation of mixed signal systems using genetic stimulus evolution and model tuning. VTS Barry John Muldrey, Sabyasachi Deyati, Michael Giardino, Abhijit Chatterjee
2013	C	`conf`	Real-time checking of linear control systems using analog checksums. IOLTS Suvadeep Banerjee, Aritra Banerjee, Abhijit Chatterjee, Jacob A. Abraham
2013	A*	`conf`	Real-time use-aware adaptive MIMO RF receiver systems for energy efficiency under BER constraints. DAC Debashis Banerjee, Shyam Kumar Devarakond, Shreyas Sen, Abhijit Chatterjee
2013	—	`conf`	Time Domain Reconstruction of Incoherently Undersampled Periodic Waveforms Using Bandwidth Interleaving. Asian Test Symposium Debesh Bhatta, Nicholas Tzou, Sen-Wen Hsiao, Abhijit Chatterjee
2013	Misc	`conf`	VAST: Post-Silicon VAlidation and Diagnosis of RF/Mixed-Signal Circuits Using Signature Tests. VLSI Design Sabyasachi Deyati, Aritra Banerjee, Barry John Muldrey, Abhijit Chatterjee
2012	J	`jnl`	A New Self-Healing Methodology for RF Amplifier Circuits Based on Oscillation Principles. IEEE Trans. Very Large Scale Integr. Syst. Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee, Duane C. Howard, John D. Cressler
2012	J	`jnl`	A Power-Scalable Channel-Adaptive Wireless Receiver Based on Built-In Orthogonally Tunable LNA. IEEE Trans. Circuits Syst. I Regul. Pap. Shreyas Sen, Debashis Banerjee, Marian Verhelst, Abhijit Chatterjee
2012	—	`conf`	A self-testable SiGe LNA and Built-in-Self-Test methodology for multiple performance specifications of RF amplifiers. ISQED Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee, Duane C. Howard, John D. Cressler
2012	J	`jnl`	BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting. J. Electron. Test. Shreyas Sen, Aritra Banerjee, Vishwanath Natarajan, Shyam Kumar Devarakond, Hyun Woo Choi, Abhijit Chatterjee
2012	J	`jnl`	Concurrent Device/Specification Cause-Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures. IEEE Des. Test Comput. Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee
2012	Misc	`conf`	Dual-frequency incoherent subsampling driven test response acquisition of spectrally sparse wideband signals with enhanced time resolution. VTS Nicholas Tzou, Thomas Moon, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee
2012	A	`conf`	Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters. ITC Xian Wang, Hyun Woo Choi, Thomas Moon, Nicholas Tzou, Abhijit Chatterjee
2012	J	`jnl`	Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya
2012	A	`conf`	Low cost high-speed test data acquisition: Accurate period estimation driven signal reconstruction using incoherent subsampling. ITC Thomas Moon, Hyun Woo Choi, Abhijit Chatterjee
2012	Misc	`conf`	Low-cost high-speed pseudo-random bit sequence characterization using nonuniform periodic sampling in the presence of noise. VTS Thomas Moon, Nicholas Tzou, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee
2012	A	`conf`	Low-cost wideband periodic signal reconstruction using incoherent undersampling and back-end cost optimization. ITC Nicholas Tzou, Debesh Bhatta, Sen-Wen Hsiao, Hyun Woo Choi, Abhijit Chatterjee
2012	A	`conf`	Low-power adaptive RF system design using real-time fuzzy noise-distortion control. ISLPED Debashis Banerjee, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee
2012	J	`jnl`	Phase Distortion to Amplitude Conversion-Based Low-Cost Measurement of AM-AM and AM-PM Effects in RF Power Amplifiers. IEEE Trans. Very Large Scale Integr. Syst. Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee
2012	C	`conf`	Pilot symbol driven monitoring of electrical degradation in RF transmitter systems using model anomaly diagnosis. IOLTS Sabyasachi Deyati, Aritra Banerjee, Abhijit Chatterjee
2012	Misc	`conf`	Power Aware Post-Manufacture Tuning of MIMO Receiver Systems. VLSI Design Debashis Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee
2012	Misc	`conf`	Real-Time, Content Aware Camera - Algorithm - Hardware Co-Adaptation for Minimal Power Video Encoding. VLSI Design Joshua W. Wells, Jayaram Natarajan, Abhijit Chatterjee, Irtaza Barlas
2012	—	`conf`	Spectral Estimation Based Acquisition of Incoherently Under-sampled Periodic Signals: Application to Bandwidth Interleaving. Asian Test Symposium Debesh Bhatta, Nicholas Tzou, Hyun Woo Choi, Abhijit Chatterjee
2012	B	`conf`	Testing of digitally assisted adaptive analog/RF systems using tuning knob - Performance space estimation. ETS Aritra Banerjee, Shyam Kumar Devarakond, Shreyas Sen, Debashis Banerjee, Abhijit Chatterjee
2012	A	`conf`	Validation signature testing: A methodology for post-silicon validation of analog/mixed-signal circuits. ICCAD Abhijit Chatterjee, Sabyasachi Deyati, Barry John Muldrey, Shyam Kumar Devarakond, Aritra Banerjee
2011	A	`conf`	Accurate signature driven power conscious tuning of RF systems using hierarchical performance models. ITC Aritra Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee
2011	Misc	`conf`	Automatic test stimulus generation for accurate diagnosis of RF systems using transient response signatures. VTS Aritra Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee
2011	J	`jnl`	Containing the Nanometer "Pandora-Box": Cross-Layer Design Techniques for Variation Aware Low Power Systems. IEEE J. Emerg. Sel. Topics Circuits Syst. Georgios Karakonstantis, Abhijit Chatterjee, Kaushik Roy
2011	—	`conf`	Diagnosing Multiple Slow Gates for Performance Tuning in the Face of Extreme Process Variations. Asian Test Symposium Xi Qian, Adit D. Singh, Abhijit Chatterjee
2011	—	`conf`	Distributed Comparison Test Driven Multiprocessor Speed-Tuning: Targeting Performance Gains under Extreme Process Variations. Asian Test Symposium Jayaram Natarajan, Joshua W. Wells, Abhijit Chatterjee, Adit D. Singh
2011	J	`jnl`	Environment-Adaptive Concurrent Companding and Bias Control for Efficient Power-Amplifier Operation. IEEE Trans. Circuits Syst. I Regul. Pap. Shreyas Sen, Rajarajan Senguttuvan, Abhijit Chatterjee
2011	J	`jnl`	Guided Probabilistic Checksums for Error Control in Low-Power Digital Filters. IEEE Trans. Computers Muhammad Mudassar Nisar, Abhijit Chatterjee
2011	—	`ch.`	Low-Power Adaptive Mixed Signal/RF Circuits and Systems and Self-Healing Solutions. Low-Power Variation-Tolerant Design in Nanometer Silicon Shreyas Sen, Vishwanath Natarajan, Abhijit Chatterjee
2011	Misc	`conf`	Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation. VLSI Design Aritra Banerjee, Vishwanath Natarajan, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Soumendu Bhattacharya
2011	C	`conf`	Orthogonally tunable inductorless RF LNA for adaptive wireless systems. ISCAS Shreyas Sen, Marian Verhelst, Abhijit Chatterjee
2011	B	`conf`	Power Aware Post-manufacture Tuning of Analog Nanocircuits. ETS Aritra Banerjee, Subho Chatterjee, Azad Naeemi, Abhijit Chatterjee
2011	C	`conf`	Real time cross-layer adaptation for minimum energy wireless image transport using bit error rate control. IOLTS Jayaram Natarajan, Shreyas Sen, Abhijit Chatterjee
2011	J	`jnl`	Signal Acquisition of High-Speed Periodic Signals Using Incoherent Sub-Sampling and Back-End Signal Reconstruction Algorithms. IEEE Trans. Very Large Scale Integr. Syst. Hyun Woo Choi, Alfred V. Gomes, Abhijit Chatterjee
2011	B	`conf`	Signature Testing and Diagnosis of High Precision S? ADC Dynamic Specifications Using Model Parameter Estimation. ETS Sehun Kook, Aritra Banerjee, Abhijit Chatterjee
2011	—	`conf`	Time Domain Characterization and Test of High Speed Signals Using Incoherent Sub-sampling. Asian Test Symposium Debesh Bhatta, Joshua W. Wells, Abhijit Chatterjee
2010	Misc	`conf`	A holistic approach to accurate tuning of RF systems for large and small multiparameter perturbations. VTS Vishwanath Natarajan, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee
2010	J	`jnl`	Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems. IEEE Des. Test Comput. Vishwanath Natarajan, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler
2010	C	`conf`	Built-in performance monitoring of mixed-signal/RF front ends using real-time parameter estimation. IOLTS Shyam Kumar Devarakond, Shreyas Sen, Aritra Banerjee, Vishwanath Natarajan, Abhijit Chatterjee
2010	Misc	`conf`	Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures. VTS Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee
2010	J	`jnl`	DSP-Driven Self-Tuning of RF Circuits for Process-Induced Performance Variability. IEEE Trans. Very Large Scale Integr. Syst. Donghoon Han, Byung-Sung Kim, Abhijit Chatterjee
2010	—	`conf`	Digitally Assisted Concurrent Built-In Tuning of RF Systems Using Hamming Distance Proportional Signatures. Asian Test Symposium Shyam Kumar Devarakond, Shreyas Sen, Vishwanath Natarajan, Aritra Banerjee, Hyun Woo Choi, Ganesh Srinivasan, Abhijit Chatterjee
2010	—	`conf`	Dynamic power modulation in baseband OFDM signal processor using application driven metrics: Image transmission and processing. LATW Muhammad Mudassar Nisar, Jayaram Natarajan, Abhijit Chatterjee
2010	C	`conf`	Error resilient video encoding using Block-Frame Checksums. IOLTS Joshua W. Wells, Jayaram Natarajan, Abhijit Chatterjee
2010	B	`conf`	Invited talk: Self-aware wireless communication and signal processing systems: Real-time adaptation for error resilience, low power and performance. ETS Abhijit Chatterjee
2010	—	`conf`	Jitter Characterization of Pseudo-random Bit Sequences Using Incoherent Sub-sampling. Asian Test Symposium Hyun Woo Choi, Abhijit Chatterjee
2010	Misc	`conf`	Low cost test and tuning of RF circuits and systems. VTS Abhijit Chatterjee, Friedrich Taenzler
2010	J	`jnl`	Low-Cost Specification Based Testing of RF Amplifier Circuits using Oscillation Principles. J. Electron. Test. Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee
2010	J	`jnl`	Post-Manufacture Tuning for Nano-CMOS Yield Recovery Using Reconfigurable Logic. IEEE Trans. Very Large Scale Integr. Syst. Maryam Ashouei, Abhijit Chatterjee, Adit D. Singh
2010	J	`jnl`	Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices. J. Electron. Test. Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam
2010	—	`conf`	Rapid Radio Frequency Amplitude and Phase Distortion Measurement Using Amplitude Modulated Stimulus. Asian Test Symposium Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee
2009	A	`conf`	A novel self-healing methodology for RF Amplifier circuits based on oscillation principles. DATE Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee
2009	J	`jnl`	Accurate Linear Model for SET Critical Charge Estimation. IEEE Trans. Very Large Scale Integr. Syst. Daniele Rossi, José Manuel Cazeaux, Martin Omaña, Cecilia Metra, Abhijit Chatterjee
2009	C	`conf`	Aggressively voltage overscaled adaptive RF systems using error control at the bit and symbol levels. IOLTS Jayaram Natarajan, Gokul Kumar, Shreyas Sen, Muhammad Mudassar Nisar, Deuk Lee, Abhijit Chatterjee
2009	—	`conf`	BIST Driven Power Conscious Post-Manufacture Tuning of Wireless Transceiver Systems Using Hardware-Iterated Gradient Search. Asian Test Symposium Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Abhijit Chatterjee
2009	C	`conf`	BIST assisted wideband digital compensation for MB-UWB transmitters. DDECS Shyam Kumar Devarakond, Shreyas Sen, Abhijit Chatterjee
2009	J	`jnl`	Checksum-Based Probabilistic Transient-Error Compensation for Linear Digital Systems. IEEE Trans. Very Large Scale Integr. Syst. Maryam Ashouei, Abhijit Chatterjee
2009	C	`conf`	Cognitive self-adaptive computing and communication systems: Test, control and adaptation. DDECS Abhijit Chatterjee
2009	J	`jnl`	Efficient EVM Testing of Wireless OFDM Transceivers Using Null Carriers. IEEE Trans. Very Large Scale Integr. Syst. Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee
2009	Misc	`conf`	Environment and Process Adaptive Low Power Wireless Baseband Signal Processing Using Dual Real-Time Feedback. VLSI Design Muhammad Mudassar Nisar, Abhijit Chatterjee
2009	J	`jnl`	Environment and Process Adaptive Low Power Wireless Baseband Signal Processing Using Dual Real-Time Feedback. J. Low Power Electron. Muhammad Mudassar Nisar, Abhijit Chatterjee
2009	C	`conf`	Iterative built-in testing and tuning of mixed-signal/RF systems. ICCD Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan
2009	—	`conf`	Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. Asian Test Symposium Sehun Kook, Hyun Woo Choi, Vishwanath Natarajan, Abhijit Chatterjee, Alfred V. Gomes, Shalabh Goyal, Le Jin
2009	A	`conf`	Low cost AM/AM and AM/PM distortion measurement using distortion-to-amplitude transformations. ITC Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee
2009	C	`conf`	Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?. IOLTS Abhijit Chatterjee, Jacob A. Abraham, Adit D. Singh, Elie Maricau, Rakesh Kumar, Christos A. Papachristou
2009	—	`conf`	Self-Calibrating Embedded RF Down-Conversion Mixers. Asian Test Symposium Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee
2009	B	`conf`	Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. ETS Sehun Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin
2008	Misc	`conf`	ACT: Adaptive Calibration Test for Performance Enhancement and Increased Testability of Wireless RF Front-Ends. VTS Vishwanath Natarajan, Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee
2008	Misc	`conf`	Adaptive Signal Scaling Driven Critical Path Modulation for Low Power Baseband OFDM Processors. VLSI Design Muhammad Mudassar Nisar, Rajarajan Senguttuvan, Abhijit Chatterjee
2008	J	`jnl`	Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems. VLSI Design Vishwanath Natarajan, Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee
2008	B	`conf`	Built-in Test of Frequency Modulated RF Transmitters Using Embedded Low-Pass Filters. ETS Rajarajan Senguttuvan, Hyun Woo Choi, Donghoon Han, Abhijit Chatterjee
2008	Misc	`conf`	Concurrent Multi-Dimensional Adaptation for Low-Power Operation in Wireless Devices. VLSI Design Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee
2008	C	`conf`	Design of process variation tolerant radio frequency low noise amplifier. ISCAS Shreyas Sen, Abhijit Chatterjee
2008	A	`conf`	Digital bit stream jitter testing using jitter expansion. DATE Hyun Woo Choi, Abhijit Chatterjee
2008	A	`conf`	EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms. ITC Vishwanath Natarajan, Hyun Woo Choi, Deuk Lee, Rajarajan Senguttuvan, Abhijit Chatterjee
2008	—	`conf`	Efficient Low-Cost Testing of Wireless OFDM Polar Transceiver Systems. ATS Deuk Lee, Vishwanath Natarajan, Rajarajan Senguttuvan, Abhijit Chatterjee
2008	Misc	`conf`	Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise. VTS Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee
2008	C	`conf`	Guided Probabilistic Checksums for Error Control in Low Power Digital-Filters. IOLTS Muhammad Mudassar Nisar, Abhijit Chatterjee
2008	J	`jnl`	Linearity Testing of A/D Converters Using Selective Code Measurement. J. Electron. Test. Shalabh Goyal, Abhijit Chatterjee
2008	J	`jnl`	Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers. IEEE Des. Test Comput. Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee
2008	J	`jnl`	Multidimensional Adaptive Power Management for Low-Power Operation of Wireless Devices. IEEE Trans. Circuits Syst. II Express Briefs Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee
2008	J	`jnl`	Performance-Optimized Design for Parametric Reliability. J. Electron. Test. Ramyanshu Datta, Jacob A. Abraham, Abdulkadir Utku Diril, Abhijit Chatterjee, Kevin J. Nowka
2008	A*	`conf`	Pro-VIZOR: process tunable virtually zero margin low power adaptive RF for wireless systems. DAC Shreyas Sen, Vishwanath Natarajan, Rajarajan Senguttuvan, Abhijit Chatterjee
2008	Misc	`conf`	Reconfiguring CMOS as Pseudo N/PMOS for Defect Tolerance in Nano-Scale CMOS. VLSI Design Maryam Ashouei, Adit D. Singh, Abhijit Chatterjee
2008	J	`jnl`	System-Level Specification Testing Of Wireless Transceivers. IEEE Trans. Very Large Scale Integr. Syst. Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee
2008	Misc	`conf`	Test Enabled Process Tuning for Adaptive Baseband OFDM Processor. VTS Muhammad Mudassar Nisar, Abhijit Chatterjee
2007	J	`jnl`	A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters. J. Electron. Test. Shalabh Goyal, Abhijit Chatterjee, Michael Purtell
2007	Misc	`conf`	Alternate Diagnostic Testing and Compensation of RF Transmitter Performance Using Response Detection. VTS Rajarajan Senguttuvan, Abhijit Chatterjee
2007	J	`jnl`	Delay-Assignment-Variation Based Optimization of Digital CMOS Circuits for Low Power Consumption. J. Low Power Electron. Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee
2007	Misc	`conf`	Enhanced Resolution Jitter Testing Using Jitter Expansion. VTS Hyun Woo Choi, Donghoon Han, Abhijit Chatterjee
2007	C	`conf`	Fault-based alternate test of RF components. ICCD Selim Sermet Akbay, Abhijit Chatterjee
2007	—	`conf`	Feedback Driven Adaptive Power Management for Minimum Power Operation of Wireless Receivers. ICECS Shreyas Sen, Rajarajan Senguttuvan, Abhijit Chatterjee
2007	—	`conf`	Fourier Spectrum-Based Signature Test: A Genetic CAD Toolbox for Reliable RF Testing Using Low-Performance Test Resources. ATS Ganesh Srinivasan, Abhijit Chatterjee, Vishwanath Natarajan
2007	J	`jnl`	Low-cost parametric test and diagnosis of RF systems using multi-tone response envelope detection. IET Comput. Digit. Tech. Donghoon Han, Soumendu Bhattacharya, Abhijit Chatterjee
2007	Misc	`conf`	Novel Cross-Loopback Based Test Approach for Specification Test of Multi-Band, Multi-Hardware Radios. VTS Vishwanath Natarajan, Ganesh Srinivasan, Abhijit Chatterjee, Craig Force
2007	Misc	`conf`	Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors. VTS Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee
2007	C	`conf`	Probabilistic Concurrent Error Compensation in Nonlinear Digital Filters Using Linearized Checksums. IOLTS Muhammad Mudassar Nisar, Maryam Ashouei, Abhijit Chatterjee
2007	Misc	`conf`	Probabilistic Self-Adaptation of Nanoscale CMOS Circuits: Yield Maximization under Increased Intra-Die Variations. VLSI Design Maryam Ashouei, Muhammad Mudassar Nisar, Abhijit Chatterjee, Adit D. Singh, Abdulkadir Utku Diril
2007	J	`jnl`	Signature Testing of Analog and RF Circuits: Algorithms and Methodology. IEEE Trans. Circuits Syst. I Regul. Pap. Ramakrishna Voorakaranam, Selim Sermet Akbay, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee
2007	J	`jnl`	Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits CoRR Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee
2007	—	`conf`	Testing RF Components with Supply Current Signatures. ATS Selim Sermet Akbay, Shreyas Sen, Abhijit Chatterjee
2007	C	`conf`	VIZOR: Virtually zero margin adaptive RF for ultra low power wireless communication. ICCD Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee
2006	J	`jnl`	A DFT Approach for Testing Embedded Systems Using DC Sensors. IEEE Des. Test Comput. Soumendu Bhattacharya, Abhijit Chatterjee
2006	—	`conf`	Adaptive Design for Performance-Optimized Robustness. DFT Ramyanshu Datta, Jacob A. Abraham, Abdulkadir Utku Diril, Abhijit Chatterjee, Kevin J. Nowka
2006	Misc	`conf`	Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors. VTS Vishwanath Natarajan, Soumendu Bhattacharya, Abhijit Chatterjee
2006	Misc	`conf`	Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures. VTS Ganesh Srinivasan, Abhijit Chatterjee, Friedrich Taenzler
2006	A	`conf`	Alternate Test of RF Front Ends with IP Constraints: Frequency Domain Test Generation and Validation. ITC Selim Sermet Akbay, Jose L. Torres, Julie M. Rumer, Abhijit Chatterjee, Joel Amtsfield
2006	J	`jnl`	An Accurate DNA Sensing and Diagnosis Methodology Using Fabricated Silicon Nanopores. IEEE Trans. Circuits Syst. I Regul. Pap. Soumendu Bhattacharya, Sankar Nair, Abhijit Chatterjee
2006	J	`jnl`	Analysis and Optimization of Nanometer CMOS Circuits for Soft-Error Tolerance. IEEE Trans. Very Large Scale Integr. Syst. Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Adit D. Singh
2006	Misc	`conf`	Application of the Reactivity Index to Propose Intra and Intermolecular Reactivity in Catalytic Materials. International Conference on Computational Science (3) Abhijit Chatterjee
2006	Misc	`conf`	Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction. VTS Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee
2006	Misc	`conf`	Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms. VLSI Design Soumendu Bhattacharya, Vishwanath Natarajan, Abhijit Chatterjee, Sankar Nair
2006	—	`conf`	Enhanced A/D Converter Signal-to-Noise-Ratio Testing in the Presence of Sampling Clock Jitter. ATS Shalabh Goyal, Abhijit Chatterjee, Yanan Shieh
2006	B	`conf`	Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study. ETS Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee
2006	J	`jnl`	Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects. J. Electron. Test. Xiangdong Xuan, Adit D. Singh, Abhijit Chatterjee
2006	B	`conf`	Low Cost Parametric Failure Diagnosis of RF Transceivers. ETS Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee
2006	Misc	`conf`	Low-Cost Production Testing of Wireless Transmitters. VLSI Design Achintya Halder, Abhijit Chatterjee
2006	C	`conf`	On-Line Error Detection in Wireless RF Transmitters Using Real-time Streaming Data. IOLTS Vishwanath Natarajan, Ganesh Srinivasan, Abhijit Chatterjee
2006	A	`conf`	Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms. DATE Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee
2006	—	`conf`	Probabilistic Error Correction in Linear Digital Filters Using Checksum Codes. LATW Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee
2006	B	`conf`	Reducing Sampling Clock Jitter to Improve SNR Measurement of A/D Converters in Production Test. ETS Shalabh Goyal, Abhijit Chatterjee, Mike Atia
2006	Misc	`conf`	Statistical Estimation of Correlated Leakage Power Variation and Its Application to Leakage-Aware Design. VLSI Design Maryam Ashouei, Abhijit Chatterjee, Adit D. Singh, Vivek De, T. M. Mak
2005	C	`conf`	A Dual-Vt Layout Approach for Statistical Leakage Variability Minimization in Nanometer CMOS. ICCD Maryam Ashouei, Abhijit Chatterjee, Adit D. Singh, Vivek De
2005	Misc	`conf`	A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode. VLSI Design Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee
2005	B	`conf`	Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers. ETS Ganesh Srinivasan, Sasikumar Cherubal, Pramodchandran N. Variyam, Melese Teklu, C. P. Wang, David Guidry, Abhijit Chatterjee
2005	J	`jnl`	Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications. J. Electron. Test. Soumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee
2005	Misc	`conf`	Built-In Test of RF Components Using Mapped Feature Extraction Sensors. VTS Selim Sermet Akbay, Abhijit Chatterjee
2005	Misc	`conf`	Design of Adaptive Nanometer Digital Systems for Effective Control of Soft Error Tolerance. VTS Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh
2005	Misc	`conf`	Level-Shifter Free Design of Low Power Dual Supply Voltage CMOS Circuits Using Dual Threshold Voltages. VLSI Design Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh
2005	J	`jnl`	Level-shifter free design of low power dual supply voltage CMOS circuits using dual threshold voltages. IEEE Trans. Very Large Scale Integr. Syst. Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh
2005	C	`conf`	Load and Logic Co-Optimization for Design of Soft-Error Resistant Nanometer CMOS Circuits. IOLTS Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Cecilia Metra
2005	Misc	`conf`	Low-Cost Alternate EVM Test for Wireless Receiver Systems. VTS Achintya Halder, Abhijit Chatterjee
2005	—	`conf`	Low-cost Production Test of BER for Wireless Receivers. Asian Test Symposium Achintya Halder, Abhijit Chatterjee
2005	—	`conf`	Low-power domino circuits using NMOS pull-up on off-critical paths. ASP-DAC Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh
2005	C	`conf`	On Transistor Level Gate Sizing for Increased Robustness to Transient Faults. IOLTS José Manuel Cazeaux, Daniele Rossi, Martin Omaña, Cecilia Metra, Abhijit Chatterjee
2005	C	`conf`	On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). IOLTS Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt
2005	J	`jnl`	Optimized wafer-probe and assembled package test design for analog circuits. ACM Trans. Design Autom. Electr. Syst. Soumendu Bhattacharya, Abhijit Chatterjee
2005	A	`conf`	Panel synopsis: reducing high-speed/RF test cost: guaranteed by design or guaranteed to fail? ITC Hosam Haggag, Abhijit Chatterjee
2005	Misc	`conf`	Production Test Methods for Measuring 'Out-of-Band' Interference of Ultra Wide Band (UWB) Devices. VTS Soumendu Bhattacharya, Abhijit Chatterjee
2005	A	`conf`	Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF. ITC Soumendu Bhattacharya, Rajarajan Senguttuvan, Abhijit Chatterjee
2005	Misc	`conf`	Prototyping an Embedded Bus-Based Parallel System. CATA Chung-Seok (Andy) Seo, Abhijit Chatterjee, Timothy J. Drabik, Behnam S. Arad, Reena Patel
2005	J	`jnl`	Pseudo Dual Supply Voltage Domino Logic Design. J. Low Power Electron. Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh
2005	—	`conf`	Robust Built-In Test of RF ICs Using Envelope Detectors. Asian Test Symposium Donghoon Han, Abhijit Chatterjee
2005	A	`conf`	Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits. DATE Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee
2005	Misc	`conf`	Test Methodologies in the Deep Submicron Era - Analog, Mixed-Signal, and RF. VLSI Design Abhijit Chatterjee, Ali Keshavarzi, Amit Patra, Siddhartha Mukhopadhyay
2005	J	`jnl`	Test generation for specification test of analog circuits using efficient test response observation methods. Microelectron. J. Achintya Halder, Abhijit Chatterjee
2005	A	`conf`	Test time reduction of successive approximation register A/D converter by selective code measurement. ITC Shalabh Goyal, Abhijit Chatterjee, Mike Atia, Howard Iglehart, Chung Yu Chen, Bassem Shenouda, Nash Khouzam, Hosam Haggag
2005	—	`conf`	This paper presents a cost-effective area-IO DRAM A CAD Tool and Algorithms. ISQED Chung-Seok (Andy) Seo, Abhijit Chatterjee, Nan M. Jokerst
2005	J	`jnl`	Time accelerated Monte Carlo simulations of biological networks using the binomial r-leap method. Bioinform. Abhijit Chatterjee, Kapil Mayawala, Jeremy S. Edwards, Dionisios G. Vlachos
2004	—	`conf`	A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits. Asian Test Symposium Soumendu Bhattacharya, Abhijit Chatterjee
2004	—	`conf`	Adaptive response surface modeling-based method for analog circuit sizing. SoCC Donghoon Han, Abhijit Chatterjee
2004	B	`conf`	Application of local design-for-reliability techniques for reducing wear-out degradation of CMOS combinational logic circuits. ETS Xiangdong Xuan, Abhijit Chatterjee, Adit D. Singh
2004	—	`conf`	Automated Test Generation and Test Point Selection for Specification Test of Analog Circuits. ISQED Achintya Halder, Abhijit Chatterjee
2004	Misc	`conf`	Concurrent RF Test Using Optimized Modulated RF Stimuli. VLSI Design Sasikumar Cherubal, Ramakrishna Voorakaranam, Abhijit Chatterjee, John McLaughlin, Jason L. Smith, David M. Majernik
2004	—	`conf`	Design and optimization of board-level optical clock distribution network for high-performance optoelectronic system-on-a-packages. ACM Great Lakes Symposium on VLSI Chung-Seok (Andy) Seo, Abhijit Chatterjee, Sang-Yeon Cho, Nan M. Jokerst
2004	—	`conf`	Device Resizing Based Optimization of Analog Circuits for Reduced Test Cost: Cost Metric and Case Study. Asian Test Symposium Donghoon Han, Abhijit Chatterjee
2004	J	`jnl`	Distributed Diagnosis of Interconnections in SoC and MCM Designs. J. Electron. Test. Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian
2004	A	`conf`	Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. DATE Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee
2004	Misc	`conf`	Feature Extraction Based Built-In Alternate Test of RF Components Using a Noise Reference. VTS Selim Sermet Akbay, Abhijit Chatterjee
2004	—	`conf`	Low-power dual V SBCCI Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Adit D. Singh
2004	Misc	`conf`	Optically Interconnected Intelligent RAM Multiprocessor: Gigascale Opto-IRAM. CATA Chung-Seok (Andy) Seo, Abhijit Chatterjee, Timothy J. Drabik
2004	Misc	`conf`	Prediction of Analog Performance Parameters Using Oscillation Based Test. VTS Ashwin Raghunathan, Hongjoong Shin, Jacob A. Abraham, Abhijit Chatterjee
2004	A	`conf`	Quasi-Oscillation Based Test for Improved Prediction of Analog Performance Parameters. ITC Ashwin Raghunathan, Ji Hwan (Paul) Chun, Jacob A. Abraham, Abhijit Chatterjee
2004	—	`conf`	Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits. Asian Test Symposium Ganesh Srinivasan, Shalabh Goyal, Abhijit Chatterjee
2004	—	`conf`	Simulation-in-the-Loop Analog Circuit Sizing Method using Adaptive Model-based Simulated Annealing. IWSOC Donghoon Han, Abhijit Chatterjee
2004	C	`conf`	Sizing CMOS Circuits for Increased Transient Error Tolerance. IOLTS Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Adit D. Singh
2004	Misc	`conf`	System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. VTS Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee
2004	—	`conf`	Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. DELTA Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee
2004	A	`conf`	Use of Embedded Sensors for Built-In-Test of RF Circuits. ITC Soumendu Bhattacharya, Abhijit Chatterjee
2003	A	`conf`	Algorithm for Achieving Minimum Energy Consumption in CMOS Circuits Using Multiple Supply and Threshold Voltages at the Module Level. ICCAD Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Hsien-Hsin S. Lee
2003	—	`conf`	An O(N)Supply Voltage Assignment Algorithm for Low-Energy Serially Connected CMOS Modules and a Heuristic Extension to Acyclic Data Flow Graphs. ISVLSI Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Kyu-won Choi, Abhijit Chatterjee
2003	A	`conf`	Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. ITC Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee
2003	J	`jnl`	Concurrent transient fault simulation for analog circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Junwei Hou, Abhijit Chatterjee
2003	—	`conf`	Free-Space Optical Interconnect for High-Performance MCM Systems. IWSOC Chung-Seok (Andy) Seo, Abhijit Chatterjee
2003	Misc	`conf`	High Coverage Analog Wafer-Probe Test Design and Co-optimization with Assembled-Package Test to Minimize Overall Test Cost. VTS Soumendu Bhattacharya, Abhijit Chatterjee
2003	—	`conf`	IC Reliability Simulator ARET and Its Application in Design-for-Reliability. Asian Test Symposium Xiangdong Xuan, Abhijit Chatterjee, Adit D. Singh, Namsoo P. Kim, Mark T. Chisa
2003	A	`conf`	Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. ITC Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee
2003	A	`conf`	Seamless Research Between Academia And Industry To Facilitate Test Of Integrated High-Speed Wireless Systems: Is This An Illusion? ITC Abhijit Chatterjee
2003	A	`conf`	UDSM (ultra-deep sub-micron)-aware post-layout power optimization for ultra low-power CMOS VLSI. ISLPED Kyu-won Choi, Abhijit Chatterjee
2002	C	`conf`	A CAD Tool for System-on-Chip Placement and Routing with Free-Space Optical Interconnect. ICCD Chung-Seok (Andy) Seo, Abhijit Chatterjee
2002	A	`conf`	A Signature Test Framework for Rapid Production Testing of RF Circuits. DATE Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee
2002	—	`conf`	Constrained Specification-Based Test Stimulus Generation for Analog Circuits Using Nonlinear Performance Prediction Models. DELTA Soumendu Bhattacharya, Abhijit Chatterjee
2002	—	`conf`	Design of Real-Number Checksum Codes Using Shared Partial Computation for CED in Linear DSP Systems. IOLTW Huy Nguyen, Abhijit Chatterjee
2002	A	`conf`	HA ISLPED Kyu-won Choi, Abhijit Chatterjee
2002	Misc	`conf`	Measuring Stray Capacitance on Tester Hardware. VTS Achintya Halder, Abhijit Chatterjee, Pramodchandran N. Variyam, John Ridley
2002	—	`conf`	PA-ZSA (Power-Aware Zero-Slack Algorithm): A Graph-Based Timing Analysis for Ultra-Low Power CMOS VLSI. PATMOS Kyu-won Choi, Abhijit Chatterjee
2002	J	`jnl`	Prediction of analog performance parameters using fast transienttesting. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Pramodchandran N. Variyam, Sasikumar Cherubal, Abhijit Chatterjee
2002	—	`conf`	System Level Power-Performance Trade-Offs in Embedded Systems Using Voltage and Frequency Scaling of Off-Chip Buses and Memory. ISSS Abhijit Chatterjee, Peeter Ellervee, Vincent John Mooney III, Jun-Cheol Park, Kyu-won Choi, Kiran Puttaswamy
2001	A	`conf`	A high-resolution jitter measurement technique using ADC sampling. ITC Sasikumar Cherubal, Abhijit Chatterjee
2001	—	`conf`	Automatic Test Generation for Analog Circuits Using Compact Test Transfer Function Models. Asian Test Symposium Biranchinath Sahu, Abhijit Chatterjee
2001	J	`jnl`	Boundary Scan-Based Relay Wave Propagation Test of Arrays of Identical Structures. IEEE Trans. Computers Koppolu Sasidhar, Abhijit Chatterjee, Yervant Zorian
2001	—	`conf`	Distance Constrained Dimensionality Reduction for Parametric Fault Test Generator. Asian Test Symposium Alfred V. Gomes, Abhijit Chatterjee
2001	—	`conf`	Efficient instruction-level optimization methodology for low-power embedded systems. ISSS Kyu-won Choi, Abhijit Chatterjee
2001	J	`jnl`	Hierarchical Diagnosis of Identical Units in a System. IEEE Trans. Computers Koppolu Sasidhar, Abhijit Chatterjee
2001	J	`jnl`	Path delay fault diagnosis in combinational circuits with implicitfault enumeration. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Pankaj Pant, Yuan-Chieh Hsu, Sandeep K. Gupta, Abhijit Chatterjee
2001	—	`conf`	Sensitivity and Reliability Evaluation for Mixed-Signal ICs under Electromigration and Hot-Carrier Effects. DFT Xiangdong Xuan, Abhijit Chatterjee
2001	—	`conf`	Specification Based Digital Compatible Built-in Test of Embedded Analog Circuits. Asian Test Symposium Achintya Halder, Abhijit Chatterjee
2001	J	`jnl`	Switching activity generation with automated BIST synthesis forperformance testing of interconnects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian
2001	A	`conf`	Test generation based diagnosis of device parameters for analog circuits. DATE Sasikumar Cherubal, Abhijit Chatterjee
2000	Misc	`conf`	An Efficient Hierarchical Fault Isolation Technique for Mixed-Signal Boards. VLSI Design Sasikumar Cherubal, Abhijit Chatterjee
2000	C	`conf`	Analog Transient Concurrent Fault Simulation with Dynamic Fault Grouping. ICCD Junwei Hou, Abhijit Chatterjee
2000	J	`jnl`	Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling. IEEE Des. Test Comput. Pramodchandran N. Variyam, Abhijit Chatterjee
2000	A	`conf`	Optimal INL/DNL testing of A/D converters using a linear model. ITC Sasikumar Cherubal, Abhijit Chatterjee
2000	A	`conf`	Partial Simulation-Driven ATPG for Detection and Diagnosis of Faults in Analog Circuits. ICCAD Sudip Chakrabarti, Abhijit Chatterjee
2000	A	`conf`	Path-delay fault diagnosis in non-scan sequential circuits with at-speed test application. ITC Pankaj Pant, Abhijit Chatterjee
2000	J	`jnl`	Specification-driven test generation for analog circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Pramodchandran N. Variyam, Abhijit Chatterjee
2000	Misc	`conf`	Test Generation for Accurate Prediction of Analog Specifications. VTS Ramakrishna Voorakaranam, Abhijit Chatterjee
2000	—	`conf`	Test generation for fault isolation in analog circuits using behavioral models. Asian Test Symposium Sasikumar Cherubal, Abhijit Chatterjee
1999	—	`conf`	A Methodology for Efficient Simulation and Diagnosis of Mixed-Signal Systems Using Error Waveforms. DFT Sasikumar Cherubal, Abhijit Chatterjee
1999	—	`conf`	A novel concurrent fault simulation method for mixed-signal circuits. ISCAS (2) Junwei Hou, William H. Kao, Abhijit Chatterjee
1999	—	`conf`	Compact Fault Dictionary Construction for Efficient Isolation of Faults in Analog and Mixed-Signal Circuits. ARVLSI Sudip Chakrabarti, Abhijit Chatterjee
1999	Misc	`conf`	Diagnostic Test Pattern Generation for Analog Circuits Using Hierarchical Models. VLSI Design Sudip Chakrabarti, Abhijit Chatterjee
1999	Misc	`conf`	Efficient Test Generation for Transient Testing of Analog Circuits Using Partial Numerical Simulation. VTS Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee
1999	A	`conf`	Efficient diagnosis of path delay faults in digital logic circuits. ICCAD Pankaj Pant, Abhijit Chatterjee
1999	J	`jnl`	Fault Detection and Automated Fault Diagnosis for Embedded Integrated Electrical Passives. J. VLSI Signal Process. Heebyung Yoon, Junwei Hou, Swapan K. Bhattacharya, Abhijit Chatterjee, Madhavan Swaminathan
1999	—	`conf`	Fault modeling and fault sampling for isolating faults in analog and mixed-signal circuits. ISCAS (2) Sudip Chakrabarti, Abhijit Chatterjee
1999	—	`conf`	Feedback Driven Backtrace of Analog Signals and its Application to Circuit Verification and Test. ARVLSI Ramakrishna Voorakaranam, Abhijit Chatterjee
1999	Misc	`conf`	Hierarchical Test Generation for Analog Circuits Using Incremental Test Development. VTS Ramakrishna Voorakaranam, Abhijit Chatterjee
1999	Misc	`conf`	Manufacturability of Mixed Signal Systems. VLSI Design Manuel d'Arbreu, Abhijit Chatterjee
1999	A	`conf`	Minimal Length Diagnostic Tests for Analog Circuits using Test History. DATE Alfred V. Gomes, Abhijit Chatterjee
1999	A	`conf`	On-line fault detection in DSP circuits using extrapolated checksums with minimal test points. ITC Sudip Chakrabarti, Abhijit Chatterjee
1999	A	`conf`	Parametric Fault Diagnosis for Analog Systems Using Functional Mapping. DATE Sasikumar Cherubal, Abhijit Chatterjee
1999	J	`jnl`	Partial Reset Methodology and Experiments for Improving Random-Pattern Testability and BIST of Sequential Circuits. J. Electron. Test. Huy Nguyen, Rabindra K. Roy, Abhijit Chatterjee
1999	A	`conf`	Robust optimization based backtrace method for analog circuits. ICCAD Alfred V. Gomes, Abhijit Chatterjee
1999	J	`jnl`	Single-probe traversal optimization for testing of MCM substrate interconnections. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Rajesh Pendurkar, Craig A. Tovey, Abhijit Chatterjee
1999	Misc	`conf`	Test Generation for Analog Circuits Using Partial Numerical Simulation. VLSI Design Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee
1998	A	`conf`	A distributed BIST technique for diagnosis of MCM interconnections. ITC Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian
1998	A	`conf`	A high throughput test methodology for MCM substrates. ITC Bruce C. Kim, David C. Keezer, Abhijit Chatterjee
1998	J	`jnl`	Activity Measures for Fast Relative Power Estimation in Numerical Transformation for Low Power DSP Synthesis. J. VLSI Signal Process. Huy T. Nguyen, Abhijit Chatterjee, Rabindra K. Roy
1998	A	`conf`	CONCERT: a concurrent transient fault simulator for nonlinear analog circuits. ICCAD Junwei Hou, Abhijit Chatterjee
1998	Misc	`conf`	Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements. VTS Pramodchandran N. Variyam, Abhijit Chatterjee
1998	C	`conf`	Fault detection and automated fault diagnosis for embedded integrated electrical passives. ICCD Heebyung Yoon, Junwei Hou, Abhijit Chatterjee, Madhavan Swaminathan
1998	Misc	`conf`	Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits. VTS Heebyung Yoon, Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi
1998	—	`conf`	Modular Fault Simulation of Mixed Signal Circuits with Fault Ranking by Severity. DFT Alfred V. Gomes, Ramakrishna Voorakaranam, Abhijit Chatterjee
1998	Misc	`conf`	Partial Reset Methodologies for Improving Random-Pattern Testability and BIST of Sequential Circuits. VLSI Design Huy Nguyen, Rabindra K. Roy, Abhijit Chatterjee
1998	J	`jnl`	Signature analysis for analog and mixed-signal circuit test response compaction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Naveena Nagi, Abhijit Chatterjee, Heebyung Yoon, Jacob A. Abraham
1998	—	`conf`	Specification-Driven Test Design for Analog Circuits. DFT Pramodchandran N. Variyam, Abhijit Chatterjee
1998	A	`conf`	Synthesis of BIST hardware for performance testing of MCM interconnections. ICCAD Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian
1998	J	`jnl`	Testing NASA's 3D-Stack MCM Space Flight Computer. IEEE Des. Test Comput. Koppolu Sasidhar, Leon Alkalai, Abhijit Chatterjee
1997	J	`jnl`	A Survey of Test Techniques for MCM Substrates. J. Electron. Test. Madhavan Swaminathan, Bruce C. Kim, Abhijit Chatterjee
1997	J	`jnl`	Concurrent Error Detection in Nonlinear Digital Circuits Using Time-Freeze Linearization. IEEE Trans. Computers Abhijit Chatterjee, Rabindra K. Roy
1997	Misc	`conf`	Design for Testability and Built-In Self-Test of Mixed-Signal Circuits: A Tutorial. VLSI Design Abhijit Chatterjee, Naveena Nagi
1997	A*	`conf`	Device-Circuit Optimization for Minimal Energy and Power Consumption in CMOS Random Logic Networks. DAC Pankaj Pant, Vivek De, Abhijit Chatterjee
1997	Misc	`conf`	FLYER: Fast Fault Simulation of Linear Analog Circuits Using Polynomial Waveform and Perturbed State Representation. VLSI Design Pramodchandran N. Variyam, Abhijit Chatterjee
1997	A	`conf`	Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis. ITC Ramakrishna Voorakaranam, Sudip Chakrabarti, Junwei Hou, Alfred V. Gomes, Sasikumar Cherubal, Abhijit Chatterjee, William H. Kao
1997	Misc	`conf`	Impact of Partial Reset on Fault Independent Testing and BIST. VLSI Design Huy Nguyen, Abhijit Chatterjee, Rabindra K. Roy
1997	Misc	`conf`	Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling. VTS Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi
1997	Misc	`conf`	Optimal Design of Checksum-Based Checkers for Fault Detection in Linear Analog Circuits. VLSI Design Heebyung Yoon, Abhijit Chatterjee, Joseph L. A. Hughes
1997	A	`conf`	Test generation for comprehensive testing of linear analog circuits using transient response sampling. ICCAD Pramodchandran N. Variyam, Abhijit Chatterjee
1996	J	`jnl`	A unified approach for fault simulation of linear mixed-signal circuits. J. Electron. Test. Ashok Balivada, Hong Zheng, Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham
1996	J	`jnl`	DC Built-In Self-Test for Linear Analog Circuits. IEEE Des. Test Comput. Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi
1996	Misc	`conf`	Hierarchical Probablistic Diagnosis of MCMs on Large-Area Substrates. VLSI Design Koppolu Sasidhar, Abhijit Chatterjee
1996	Misc	`conf`	Low-cost DC built-in self-test of linear analog circuits using checksums. VLSI Design Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi
1996	Misc	`conf`	Low-cost diagnosis of defects in MCM substrate interconnections. VTS Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan
1996	Misc	`conf`	Non-robust tests for stuck-fault detection using signal waveform analysis: feasibility and advantages. VTS Abhijit Chatterjee, Rathish Jayabharathi, Pankaj Pant, Jacob A. Abraham
1996	A	`conf`	Optimal Multiple Chain Relay Testing Scheme for MCMs on Large Area Substrates. ITC Koppolu Sasidhar, Abhijit Chatterjee, Yervant Zorian
1996	C	`conf`	Optimal single probe traversal algorithm for testing of MCM substrat. ICCD Rajesh Pendurkar, Abhijit Chatterjee, Craig A. Tovey
1996	—	`conf`	Relay Propagation Scheme for Testing of MCMs on Large Area Substrates. ED&TC Koppolu Sasidhar, Abhijit Chatterjee, Yervant Zorian
1995	A	`conf`	A Novel Low-Cost Approach to MCM Interconnect Test. ITC Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan, David E. Schimmel
1995	J	`jnl`	A submicron DC MOSFET model for simulation of analog circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Abhijit Chatterjee, Charles F. Machala III, Ping Yang
1995	A	`conf`	Distributed Probabilistic Diagnosis of MCMs on Large Area. ITC Koppolu Sasidhar, Abhijit Chatterjee, Vinod K. Agarwal, Joseph L. A. Hughes
1995	Misc	`conf`	Efficient multisine testing of analog circuits. VLSI Design Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham
1995	—	`conf`	OPTIMUS: a new program for OPTIMizing linear circuits with number-splitting and shift-and-add decompositions. ARVLSI Huy Nguyen, Abhijit Chatterjee
1994	C	`conf`	A Signature Analyzer for Analog and Mixed-signal Circuits. ICCD Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham
1994	Misc	`conf`	Design for diagnosability of linear digital filters using time-space expansion. VTS Abhijit Chatterjee, Rabindra K. Roy
1994	J	`jnl`	Guest Editors' Introduction: Low-Power VLSI Design. IEEE Des. Test Comput. Kaushik Roy, Abhijit Chatterjee
1994	A	`conf`	RAFT191486: a novel program for rapid-fire test and diagnosis of digital logic for marginal delays and delay faults. ICCAD Abhijit Chatterjee, Jacob A. Abraham
1994	Misc	`conf`	Synthesis of Low Power Linear DSP Circuits Using Activity Metrics. VLSI Design Abhijit Chatterjee, Rabindra K. Roy
1993	A*	`conf`	An Architectural Transformation Program for Optimization of Digital Systems by Multi-Level Decomposition. DAC Abhijit Chatterjee, Rabindra K. Roy
1993	C	`conf`	Concurrent Error Detection in Nonlinear Digital Circuits with Applications to Adaptive Filters. ICCD Abhijit Chatterjee, Rabindra K. Roy
1993	J	`jnl`	Concurrent error detection and fault-tolerance in linear analog circuits using continuous checksums. IEEE Trans. Very Large Scale Integr. Syst. Abhijit Chatterjee
1993	A*	`conf`	DRAFTS: Discretized Analog Circuit Fault Simulator. DAC Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham
1993	J	`jnl`	Fault simulation of linear analog circuits. J. Electron. Test. Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham
1993	A	`conf`	Fault-based automatic test generator for linear analog circuits. ICCAD Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham
1993	Misc	`conf`	Greedy Hardware Optimization for Linear Digital Systems Using Number Splitting. VLSI Design Abhijit Chatterjee, Rabindra K. Roy, Manuel A. d'Abreu
1993	J	`jnl`	Greedy hardware optimization for linear digital circuits using number splitting and refactorization. IEEE Trans. Very Large Scale Integr. Syst. Abhijit Chatterjee, Rabindra K. Roy, Manuel A. d'Abreu
1993	C	`conf`	MIXER: Mixed-Signal Fault Simulator. ICCD Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham
1993	J	`jnl`	The Design of Fault-Tolerant Linear Digital State Variable Systems: Theory and Techniques. IEEE Trans. Computers Abhijit Chatterjee, Manuel A. d'Abreu
1993	J	`jnl`	Visualization in linear programming using parallel coordinates. Pattern Recognit. Abhijit Chatterjee, Partha Pratim Das, Soumendu Bhattacharya
1992	C	`conf`	A New Approach to Fault-Tolerance in Linear Analog Systems Based on Checksum-Coded State Space Representations. ICCD Abhijit Chatterjee
1992	A	`conf`	Automatic test generation for linear digital systems with bi-level search using matrix transform methods. ICCAD Rabindra K. Roy, Abhijit Chatterjee, Janak H. Patel, Jacob A. Abraham, Manuel A. d'Abreu
1992	Misc	`conf`	Checksum-based concurrent error detection in linear analog systems with second and higher order stages. VTS Abhijit Chatterjee
1992	Misc	`conf`	Delay fault testing of iterative arithmetic arrays. VTS Rabindra K. Roy, Naveena Nagi, Abhijit Chatterjee, Manuel A. d'Abreu
1991	J	`jnl`	A Rapid-Prototyping Environment for Digital-Signal Processors. IEEE Des. Test Comput. Richard I. Hartley, Kenneth Welles II, Michael J. Hartman, Abhijit Chatterjee, Paul Delano, Barbara Molnar, Colin Rafferty
1991	—	`conf`	Concurrent Error Detection and Fault-Tolerance in Linear Digital State Variable Systems. FTCS Abhijit Chatterjee, Manuel A. d'Abreu
1991	A	`conf`	Concurrent Error Detection in Linear Analog and Switched-Capacitor State Variable Systems Using Continuous Checksums. ITC Abhijit Chatterjee
1991	J	`jnl`	Efficient testing strategies for bit- and digit-serial arrays used in digital signal processors. Digit. Signal Process. Abhijit Chatterjee, Rabindra K. Roy, Jacob A. Abraham, Janak H. Patel
1991	C	`conf`	Syndrome-Based Functional Delay Fault Location in Linear Digital Data-Flow Graphs. ICCD Abhijit Chatterjee, Manuel A. d'Abreu
1991	J	`jnl`	Test Generation for Iterative Logic Arrays Based on an N-Cube of Cell States Model. IEEE Trans. Computers Abhijit Chatterjee, Jacob A. Abraham
1991	J	`jnl`	Test generation, design-for-testability and built-in self-test for arithmetic units based on graph labeling. J. Electron. Test. Abhijit Chatterjee, Jacob A. Abraham
1990	A*	`conf`	A New Simultaneous Circuit Partitioning and Chip Placement Approach Based on Simulated Annealing. DAC Abhijit Chatterjee, Richard I. Hartley
1990	—	`conf`	Rapid prototyping using high density interconnects. EURO-DAC Richard I. Hartley, Kenneth Welles II, Michael J. Hartman, Paul Delano, Abhijit Chatterjee
1990	J	`jnl`	The Testability of Generalized Counters Under Multiple Faulty Cells. IEEE Trans. Computers Abhijit Chatterjee, Jacob A. Abraham
1990	—	`—`	The testability of regular logic structures Abhijit Chatterjee
1988	A	`conf`	A submicron MOSFET model for simulation of analog circuits. ICCAD Abhijit Chatterjee, Charles F. Machala III, Ping Yang
1988	A	`conf`	NCUBE: an automatic test generation program for iterative logic arrays. ICCAD Abhijit Chatterjee, Jacob A. Abraham
1987	J	`jnl`	On the C-Testability of Generalized Counters. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Abhijit Chatterjee, Jacob A. Abraham