| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2025 | J | jnl |
Real-Time Inter-Turn Short-Circuit Fault Detection and Localization in Six-Phase Induction Machines.
IEEE Trans. Ind. Electron.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | C | conf |
IECON
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | C | conf |
IECON
|
| 2023 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | — | conf |
VSS
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | C | conf |
IAS
|
| 2020 | — | conf |
CCTA
|
| 2020 | C | conf |
IAS
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | C | conf |
IECON
|
| 2019 | C | conf |
IECON
|
| 2019 | C | conf |
IECON
|
| 2019 | C | conf |
IECON
|
| 2019 | J | jnl |
IEEE Access
|
| 2018 | C | conf |
IECON
|
| 2018 | C | conf |
IAS
|
| 2016 | — | conf |
MWSCAS
|
| 2016 | — | conf |
VSS
|
| 2016 | C | conf |
IAS
|
| 2015 | C | conf |
IECON
|
| 2015 | C | conf |
IECON
|
| 2014 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2013 | — | conf |
ASCC
|
| 2012 | C | conf |
IECON
|
| 2012 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|