Abalhassan Sheikh

13 papers A 3B 2Misc 2Journal 4Unranked 2
YearRankTypeTitle / Venue / Authors
2023 J jnl
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing.
J. Electron. Test.
Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2023 J jnl
Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction.
IEEE Des. Test
Praise O. Farayola, Ekaniyere Oko-Odion, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022 J jnl
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing.
J. Electron. Test.
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022 — conf
Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing.
DFT
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022 B conf
Graph Theory Approach for Multi-site ATE Board Parameter Extraction.
ETS
Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022 A conf
Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing.
ITC
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2022 Misc conf
The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing.
VTS
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021 B conf
An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study.
ETS
Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021 J jnl
Detection of Site to Site Variations From Volume Measurement Data in Multisite Semiconductor Testing.
IEEE Trans. Instrum. Meas.
Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021 — conf
Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation.
DTIS
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2021 A conf
Systematic Hardware Error Identification and Calibration for Massive Multisite Testing.
ITC
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2020 Misc conf
Quantile - Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing.
VTS
Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen
2018 A conf
Fast and accurate linearity test for DACs with various architectures using segmented models.
ITC
Shravan K. Chaganti, Abalhassan Sheikh, Sumit Dubey, Frank Ankapong, Nitin Agarwal, Degang Chen