Aaron W. Langham

12 papers Journal 12
YearRankTypeTitle / Venue / Authors
2026 J jnl
Parallelization Techniques for Behavioral Microgrid Simulation.
IEEE Access
Ethan T. Almquist, Aaron W. Langham, Stephen J. Bruno, Steven B. Leeb
2026 J jnl
Physics-Informed Domain Adaptation for Electrical Energy Monitoring.
IEEE Trans. Smart Grid
Aaron W. Langham, Thomas C. Krause, Steven B. Leeb
2026 J jnl
The Price of Undersampling Nonintrusive Electrical Data.
IEEE Access
Andrés I. Martínez, Aaron W. Langham, John S. Donnal, Steven B. Leeb
2025 J jnl
Cathodic Protection Measurement and Modeling.
IEEE Trans. Instrum. Meas.
Erik K. Saathoff, Michael J. Bishop, Isabelle C. Levitsky, Jacob D. Skimmons, Aaron W. Langham, Steven B. Leeb
2025 J jnl
Derived Power Streams for Fault Detection and Condition-Based Maintenance.
IEEE Access
Aaron W. Langham, Thomas C. Krause, Steven B. Leeb
2024 J jnl
Multistream Power Monitoring for Energy Systems.
IEEE Trans. Smart Grid
Aaron W. Langham, Thomas C. Krause, Daisy H. Green, Steven B. Leeb
2023 J jnl
Adaptation for Automated Drift Detection in Electromechanical Machine Monitoring.
IEEE Trans. Neural Networks Learn. Syst.
Daisy H. Green, Aaron W. Langham, Rebecca A. Agustin, Devin W. Quinn, Steven B. Leeb
2023 J jnl
Characterizing Low-Data-Rate Power Line Communication Channels.
IEEE Trans. Instrum. Meas.
Adedayo O. Aderibole, Erik K. Saathoff, Kevin J. Kircher, Aaron W. Langham, Leslie K. Norford, Steven B. Leeb
2023 J jnl
Physics-Informed Feature Space Evaluation for Diagnostic Power Monitoring.
IEEE Trans. Ind. Informatics
Daisy H. Green, Aaron W. Langham, Rebecca A. Agustin, Devin W. Quinn, Steven B. Leeb
2023 J jnl
Securable Networks for Nonintrusive Sensor Fusion.
IEEE Trans. Instrum. Meas.
Aaron W. Langham, Andrew Moeller, Devin W. Quinn, Thomas C. Krause, Daisy H. Green, Steven B. Leeb
2022 J jnl
Energy Disaggregation of Stochastic Power Behavior.
IEEE Access
Daisy H. Green, Aaron W. Langham, Devin W. Quinn, Thomas C. Krause, Steven R. Shaw, Steven B. Leeb
2022 J jnl
Resolution Analysis for Power System Measurement and Transient Identification.
IEEE Trans. Instrum. Meas.
Aaron W. Langham, Daisy H. Green, Steven B. Leeb