| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2023 | — | conf |
VLSI Technology and Circuits
|
| 2016 | — | conf |
Computer-Aided Diagnosis
|
| 2016 | — | conf |
ISPACS
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2010 | J | jnl |
Microelectron. Reliab.
|
| 2009 | J | jnl |
Microelectron. Reliab.
|
| 2008 | A | conf |
IPDPS
|
| 2007 | J | jnl |
Microelectron. Reliab.
|
| 2007 | J | jnl |
Int. J. High Perform. Comput. Appl.
|
| 2007 | J | jnl |
Int. J. High Perform. Comput. Appl.
|
| 1999 | J | jnl |
Int. J. Syst. Sci.
|
| 1998 | J | jnl |
Int. J. Syst. Sci.
|
| 1988 | A | conf |
ITC
|